Extraction: Devices

The LayoutEditor can be used to generate a netlist from a layout. To do so any device part of the layout has to be detected and its connection calculated. The device detection is straight forward if the schematic driven layout part of the LayoutEditor is used. In this case, all device information is stored in the layout as properties of the cell reference to the cell representing the device. This information can be viewed with the PropertiesMode by pressing the little component symbol. The symbol is only be visible if the device information is present.

If a device is modified after the schematic driven layout or the layout is done by another software or by parasitic devices, the required information to generate a netlist will not be correct/missing. In that case the device has to be extracted from the layout in a different way. The LayoutEditor includes methods to do so. The required method for each component is described with each component. Check/change it with the EditComponent. The extraction itself is done using ExtractComponent. Alternatively, manual extraction can be performed by ExtractComponent(manual). In both ways new cells will be refered in the layout containing all required device information. With DeleteExtractedDevices previously extracted devices are removed from the layout. These automatic extraction methods are available:

C-parallelPlate

Parallel plate capacitors are detected and calculated. The capacitance area is the overlap of layerA and layerB.

Extraction Method Parameter
layerA capacitors electrode layer 1
layerB capacitors electrode layer 2
areaCap area capacitance in F/m²
edgeCap edge capacitance in F/m
layerContactA connection layer for electrode 1, used for connector placement (optional)
layerContactB connection layer for electrode 2, used for connector placement (optional)
layerPlaceA layer used for connector 1 (optional)
layerPlaceB layer used for connector 2 (optional)
ports comma separated list of ports as used by the component, order: top, bottom

 

Device Parameter Values
$capSci capacitance in scientific notation (e.g. 1.4e-5)
$capEng capacitance in engineering notation (e.g. 140n)
C-nodeToGround

Calculates the capacitance of all shapes of an node to ground. Node of refered cell references without a connection to the current call are not calculated. However any shape connected to the current cell is considered. Shapes on layers not listed with area and edge caps are not considered.

Extraction Method Parameter
areaCap[layerName1] area capacitance in F/m²
edgeCap[layerName1] edge capacitance in F/m
areaCap[layerName2] area capacitance in F/m²
edgeCap[layerName2] edge capacitance in F/m
...
ports port as used by the component

 

Device Parameter Values
$capSci capacitance in scientific notation (e.g. 1.4e-5)
$capEng capacitance in engineering notation (e.g. 140n)
MOS-default

A typical 3 connector MOS transitor, optional layerRequiredWell and layerOutsideWell can be used to separate between NMOS and PMOS.

Extraction Method Parameter
layerPoly poly layer
layerActive active layer
layerContact contact layer
layerRequiredWell layer of a optional required well
layerOutsideWell layer of a well not covered by the component
ports comma separated list of ports as used by the component, order:source,drain,gate

 

Device Parameter Values
$lengthSci transitor length in scientific notation (e.g. 1.4e-5)
$lengthEng transitor length in engineering notation (e.g. 140n)
$widthSci transitor length in scientific notation (e.g. 1.4e-5)
$widthEng transitor length in engineering notation (e.g. 140n)
$areaSourceSci area of source contact in scientific notation
$areaSourceEng area of source contact in engineering notation
$perimeterSourceSci perimeter of source contact in scientific notation
$perimeterSourceEng perimeter of source contact in engineering notation
$areaDrainSci area of drain contact in scientific notation
$areaDrainEng area of drain contact in engineering notation
$perimeterDrainSci perimeter of drain contact in scientific notation
$perimeterDrainEng perimeter of drain contact in engineering notation
BJT-vertical

Detects and extracts a typical vertical bipolar junction transistor.

Extraction Method Parameter
layerBurried layer of the buried conductor
layerContact contact layer
layerDeep layer of deep diffusion to contact buried layer
layerWell layer of the basic well
layerDiffusion layer of the diffusion of the emitter
ports port as used by the component

 

Device Parameter Values
none
BJT-lateral

Detects and extracts a (parasitic) lateral bipolar junction transistor.

Extraction Method Parameter
layerBurried layer of the buried conductor (basic)
layerContact contact layer
layerDeep layer of deep diffusion to contact buried layer
layerWell layer of the emitter/collector well
maximalEmitterDistance maximal distance of collector and emitter
ports port as used by the component

 

Device Parameter Values
none
R-thinFilm

Calculates a thin film resistor. Resitive and connecting layers have to be specified. Resistance is calculated with finite differences. 2 connector and 3 connector resistors are supported. Where there are resistors with more connectors, the resulting resistance between all connectors is extracted. Multi connections per connector are detected and fully supported.

Extraction Method Parameter
layerResistance resistive layer
layerContact connecting layer
rsquare square resistance of the resistive layer
resolution resolution of the finite differences calculation. Values between 0 and 100
ports port as used by the component

 

Device Parameter Values
$resSci resistance in scientific notation (e.g. 1.4e-5)
$resEng resistance in engineering notation (e.g. 140n)